prof. RNDr. Václav Holý, CSc.
Professor, Department of Condensed Matter Physics
Office: pav. 09/02028
Kotlářská 267/2
611 37 Brno
Phone: | +420 549 49 4360 |
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E‑mail: |
social and academic networks: |
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Total number of publications: 210
1995
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Effect of interfacial-roughness replication on the diffuse x-ray reflection from periodical multilayers
Appl. Phys. A, year: 1995, volume: 1995, edition: 60
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Elastic strains in GaAs/AlAs quantum dots studied by high-resolution x-ray diffraction
Physical Review B, year: 1995, volume: 52(1995), edition: 11
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Grazing-incidence diffraction from multilayers
Physical Review B, year: 1995, volume: 51(1995), edition: 23
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High Resolution x-ray diffractometry of ZnTe layers at elevated temperatures.
Journal of Applied Physics, year: 1995, volume: 78, edition: 2
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Interface roughness in surface-sensitive x-ray methods
J. Phys. D: Appl. Phys., year: 1995, volume: 28, edition: -
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Interface study of W-Si/Si and obliquely deposided W/Si multilayers by grazing-incidence high-resolution x-ray diffraction
J. Phys. D: Appl. Phys., year: 1995, volume: 28, edition: -
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Investigation of strain relaxation of Ge 1-x Si x epilayers on Ge (001) by high-resolution x-ray reciprocal space mapping
Semicond. Sci. Technol., year: 1995, volume: 10, edition: -
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Konzultační cvičení II
Year: 1995, number of pages: 86 s.
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Strain relaxation and misfit dislocations in compositionally graded Si 1-x Ge x layers on Si (001)
Journal of Crystal Growth, year: 1995, volume: 1995, edition: 157
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X-ray diffraction on Fibonacci superlattices
Acta Crystallographica A, year: 1995, volume: 51, edition: 9999