Mgr. Daniel Franta, Ph.D.
Výzkumný pracovník II, Optics for Thin films and Solid surfaces
office: pav. 07/02012
Kotlářská 267/2
611 37 Brno
phone: | +420 549 49 3836 |
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e‑mail: |
social and academic networks: |
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Curriculum vitae
- Person Identification
- Daniel Franta, MA PhD, born February 14, 1970
- Workplace
- Department of Physical Electronics
Faculty of Science, Masaryk University
- Department of Physical Electronics
- Employment Position
- scientist
- Education and Academic Qualifications
- 2000: Ph.D. in field Wave and Particle Optics at Masaryk University, thesis "Interaction of Light with non-ideal layered systems"
- 1994: Mgr. (M.A.) in field Physics at Masaryk University, thesis "Scattering of Light by Layered Systems Containing Stochastic Rough Boundaries"
- Employment Summary
- since 1997: Masaryk University, scientist
- Academical Stays
- 2003: Institute of Semiconductor Physics, Johannes Kepler University, Linz, Austria (10 days)
- 2002: Laboratoire de Magnétisme et d'Optique, Université de Versailles Saint-Quentin-en-Yvelines, Versailles, France (3 months)
- 2002: Institute of Semiconductor Physics, Johannes Kepler University, Linz, Austria (10 days)
- 2001: Institute of Semiconductor Physics, Johannes Kepler University, Linz, Austria (2 times 10 days)
- 2000: Institute of Semiconductor Physics, Johannes Kepler University, Linz, Austria (10 days)
- Selected Publications
- FRANTA, Daniel, David NEČAS, Lenka ZAJÍČKOVÁ, Ivan OHLÍDAL, Jiří STUCHLÍK a Dagmar CHVOSTOVA. Application of sum rule to the dispersion model of hydrogenated amorphous silicon. Thin Solid Films. Lausanne: Elsevier Science, 2013, roč. 539, Jul, s. 233-244. ISSN 0040-6090. Dostupné z: https://dx.doi.org/10.1016/j.tsf.2013.04.012. URL info
- FRANTA, Daniel, David NEČAS, Lenka ZAJÍČKOVÁ, Ivan OHLÍDAL a Jiří STUCHLÍK. Advanced modeling for optical characterization of amorphous hydrogenated silicon films. Thin Solid Films. Lausanne: Elsevier Science, 2013, roč. 541, Aug, s. 12-16. ISSN 0040-6090. Dostupné z: https://dx.doi.org/10.1016/j.tsf.2013.04.129. URL info
2014/03/08