Project information
Výzkum dielektrických vrstev TixSiyOz připravených plazmochemickou metodou (PECVD) pro optické a elektronické aplikace

Project Identification

7AMB15FR036

Project Period

1/2015 - 12/2016

Investor / Pogramme / Project type

Ministry of Education, Youth and Sports of the CR

Mobility Activity

MU Faculty or unit

Central European Institute of Technology

doc. Mgr. Lenka Zajíčková, Ph.D.

TiO2 thin films exhibit high dielectric constant (between 50 and 100) and optical refractive index (1.8

Publications

Total number of publications: 2

2020

Unravelling local environments in mixed TiO2-SiO2 thin films by XPS and ab initio calculations

ONDRAČKA Pavel NEČAS David CARETTE Michele ELISABETH Stephane HOLEC David GRANIER Agnes GOULLET Antoine ZAJÍČKOVÁ Lenka RICHARD-PLOUET Mireille

Article in Periodical

Applied Surface Science, year: 2020, volume: 510, edition: April 2020, DOI

2017

Optical properties of TixSi1-xO2 solid solutions

ONDRAČKA Pavel HOLEC David NEČAS David DVOŘÁKOVÁ Eva ELISABETH Stéphane GOULLET Antoinne ZAJÍČKOVÁ Lenka

Article in Periodical

Physical Review B, year: 2017, volume: 95, edition: 19, DOI