Publication details
Apparatus for temperature-dependent cathodoluminescence characterization of materials
| Authors | |
|---|---|
| Year of publication | 2014 |
| Type | Article in Periodical |
| Magazine / Source | Measurement Science and Technology |
| Citation | |
| web | http://iopscience.iop.org/0957-0233/25/7/075601 |
| Doi | http://dx.doi.org/10.1088/0957-0233/25/7/075601 |
| Keywords | cathodoluminescence, electron beam, cryostat, scintillator, YAG:Ce |
| Description | An apparatus for characterization of temperature-dependent cathodoluminescence (CL) of solid-state materials is presented. This device excites a specimen using an electron beam and the CL emission is collected from the specimen side opposite the e-beam irradiation. The design of the temperature-controlled specimen holder that enables cooling down to 100 K and heating up to 500 K is described. The desired specimen temperature is automatically stabilized using a PID controller, which is the proportional-integral-derivative control feedback loop. Moreover, the specimen holder provides in situ e-beam current measurement during the specimen excitation. The apparatus allows the measurement of the CL intensity, the CL spectrum, or the CL intensity decay depending on the specimen temperature, or on a variety of excitation conditions, such as excitation energy, electron current (dose), or excitation duration. The apparatus abilities are demonstrated by an example of the CL measurements of the YAG:Ce single-crystal scintillator. |