Publication details
Beam shaping and probe characterization in the scanning electron microscope
| Authors | |
|---|---|
| Year of publication | 2021 |
| Type | Article in Periodical |
| Magazine / Source | Ultramicroscopy |
| Citation | |
| Doi | http://dx.doi.org/10.1016/j.ultramic.2021.113268 |
| Keywords | Electron diffraction; SEM; Electron beam structuring; Spot shape measurement; Electron vortex beam |
| Description | Here we demonstrate the use of nanofabricated grating holograms to diffract and shape electrons in a scanning electron microscope. The diffraction grating is placed in an aperture in the column. The entire diffraction pattern can be passed through the objective lens and projected onto the specimen, or an intermediate aperture can be used to select particular diffracted beams. We discuss several techniques for characterizing the diffraction pattern. The grating designs can incorporate features that can influence the phase and intensity of the diffracted SEM probe. We demonstrate this by producing electron vortex beams. |