Optical analysis of weakly absorbing inhomogeneous thin films by means of the envelope method of spectroscopic reflectometry
Authors | |
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Year of publication | 1997 |
Type | Article in Periodical |
Magazine / Source | Jemná mechanika a optika |
MU Faculty or unit | |
Citation | OHLÍDAL, Ivan and Karel NAVRÁTIL. Optical analysis of weakly absorbing inhomogeneous thin films by means of the envelope method of spectroscopic reflectometry. Jemná mechanika a optika. Přerov: Physical Institute, ASCR, 1997, vol. 42, No 3, p. 76-79. ISSN 0447-6441. |
Field | Optics, masers and lasers |