X-ray reflectivity investigations of the interface morphology in strained SiGe/Si multilayers

• Authors: HOLÝ Václav; DARHUBER A.A.; STANGL J.; BAUER G.; NUTZEL J.; ABSTREITER G.
• Year of publication: 1998
• Type: Article in Periodical
• Magazine / Source: Semicond. Sci. Technol.
• MU Faculty or unit: Faculty of Science
• Field: Solid matter physics and magnetism
• Keywords: x-ray

Related projects

• The morfology of the interfaces in heteroepitaxial multilayers