Publication details
Grazing Incidence X-ray Diffraction and Wide Angle X-ray Scattering using Laboratory Sources
| Authors | |
|---|---|
| Year of publication | 2022 |
| Type | Appeared in Conference without Proceedings |
| MU Faculty or unit | |
| Citation | |
| Description | Grazing incidence (GI) X-ray scattering techniques are well established non-destructive methods for characterization of thin films crystal structure and morphology. Their main features are the depth resolution and the enhancement of the scattering from the film surface. The first part of the talk will deal with the basics of interaction of X-rays with solid materials and the geometry of X-ray scattering experiments, which are necessary for understanding GI techniques. Additionally, examples of possible setups for measurements of grazing incidence in-plane X-ray diffraction (GIIXRD) and grazing incidence wide angle scattering (GIWAXS) in home laboratories will be shown.The attention will be paid to advantages and disadvantages of the individual setups. The second part of the talk will deal with examples of applications of home- laboratory GIIXRD and GIWAXS measurements for characterization of thin films of organic semiconductors. In particular, the following experiments and results will be featured: (i) A demonstration of possibility to characterize molecular monolayer of a small molecule organic semiconductor using home-laboratory source and a comparison GIIXRD performance while using laboratory and synchrotron source, respectively. (ii) In-situ observation of annealing induced phase transfor- mations using GIWAXS. |
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