Publication details
Optical constants of ZnTe and ZnSe epitaxial thin films
| Authors | |
|---|---|
| Year of publication | 2003 |
| Type | Article in Periodical |
| Magazine / Source | Acta Physica Slovaca |
| MU Faculty or unit | |
| Citation | |
| web | http://hydra.physics.muni.cz/~franta/bib/APS53_95.html |
| Field | Solid matter physics and magnetism |
| Keywords | SPECTROSCOPIC ELLIPSOMETRY; MATRIX FORMALISM; CARBON-FILMS; MULTISAMPLE; GAAS |
| Description | In this paper the spectral dependences of the optical constants, i.e. refractive index and extinction coefficient, are presented within the spectral region 220-850 nm. For determining these spectral dependences a multi-sample modification of the combined optical method based on a simultaneous interpretation of experimental data corresponding to variable angle spectro-scopic ellipsometry and near-normal spectroscopic reflectometry is used. Further, physical models and an iterative procedure enabling us to determine the spectral dependences of the optical constants of both the epitaxial films are described in detail. The spectral dependences of the optical constants are introduced in the forms of curves and tables. |
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