You are here:
Publication details
Thermal stability of SiOxCyHz films prepared by PECVD
Authors | |
---|---|
Year of publication | 2005 |
Type | Article in Periodical |
Magazine / Source | Chemické listy |
MU Faculty or unit | |
Citation | |
Field | Plasma physics |
Keywords | thermal stability; TDS; PECVD; FTIR; RBSW; ERDA |
Description | Thermal stability of SiOxCyHz films prepared using PECVD was studied by TDS, FTIR, RBS, ERDA and spectroscopic elipsometry. |
Related projects: |