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Publication details
Reproducibility in X-ray reflectometry: results from the first world-wide round-robin experiment
Authors | |
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Year of publication | 2008 |
Type | Article in Periodical |
Magazine / Source | J. Appl. Crystallography |
MU Faculty or unit | |
Citation | |
Web | http://scripts.iucr.org/cgi-bin/paper?he5386 |
Field | Solid matter physics and magnetism |
Keywords | x-ray reflectometry; round robin; layer structures |
Description | X-ray reflectometry (XRR) is a well established technique to evaluate quantitatively electron density, thickness and roughness of thin layers. In this paper, results of the first world-wide XRR round-robin experiment, involving 20 laboratories, are presented and discussed. The round-robin experiment was performed within the framework of the VAMAS Project "X-ray reflectivity measurements for evaluation of thin films and multilayers", the aim of which is to produce a good practice manual for XRR. The reproducibility of measurements obtained using different equipment has been investigated. The influence of the fitting of the experimental data was shown to be non-negligible compared with the experimental factors. The dynamic intensity range proves to be an important parameter for obtaining a good quality measurement. |
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