Interface roughness in SiGe quantum-cascade structures from x-ray reflectivity studies

• Authors: ROCH Tomáš; MEDUŇA Mojmír; STANGL Julian; HESSE Anke; LECHNER Rainer T; BAUER Guenther; DEHLINGER G.; DIEHL L.; GENNSER U.; MÜLLER Elisabeth; GRÜTZMACHER Detlev
• Year of publication: 2001
• Type: Article in Periodical
• Magazine / Source: Journal of Applied Physics
• MU Faculty or unit: Faculty of Science
• Field: Solid matter physics and magnetism
• Keywords: superlatitces; multilayers; scattering; quality
• Description: We have investigated the structural properties of Si/SiGe electroluiminescent quantum-cascade structures, by means of x-ray reflectivity and diffraction.