Publication details
Very Low Energy Scanning Electron Microscopy of Free-Standing Ultrathin Films
| Authors | |
|---|---|
| Year of publication | 2010 |
| Type | Article in Periodical |
| Magazine / Source | Materials Transactions |
| MU Faculty or unit | |
| Citation | |
| Web | http://www.jim.or.jp/journal/e/51/02/265.html |
| Field | Solid matter physics and magnetism |
| Keywords | low energy scanning electron microscopy, thin foils, transmission of very slow electrons |
| Description | Instrument and methodology is presented for very low energy scanning transmission electron microscopy. The detector system provides simultaneous acquisitions of total reflected and transmitted electron fluxes. Introductory experiments incorporated examination of ultrathin foils of gold, carbon and graphene flakes. Extremely sensitive thickness contrast obtained at units of eV is demonstrated. The phenomenon of electron transmissivity apparently exceeding 100% owing to the contribution of secondary electrons released near to the exit surface is described and discussed. |