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Characterization of ultrananocrystalline diamond thin films using low energy scanning electron microscopy
Autoři | |
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Rok publikování | 2011 |
Druh | Konferenční abstrakty |
Fakulta / Pracoviště MU | |
Citace | |
Popis | This paper deals with the low energy scanning electron microscopy characterization of ultrananocrystalline diamond films. These films were prepared by plasma enhanced chemical vapor deposition (PECVD) using dual frequency discharge. |
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