![Jak na přijímačky](https://cdn.muni.cz/media/3633702/image_1.jpg?mode=crop¢er=0.5,0.5&rnd=133572412150000000&heightratio=0.5&width=278)
Informace o publikaci
Characterization of ultrananocrystalline diamond thin films using low energy scanning electron microscopy
Autoři | |
---|---|
Rok publikování | 2011 |
Druh | Konferenční abstrakty |
Fakulta / Pracoviště MU | |
Citace | |
Popis | This paper deals with the low energy scanning electron microscopy characterization of ultrananocrystalline diamond films. These films were prepared by plasma enhanced chemical vapor deposition (PECVD) using dual frequency discharge. |
Související projekty: |