prof. RNDr. Ivan Ohlídal, DrSc.
Head, Optics for Thin films and Solid surfaces
office: pav. 06/01031
Kotlářská 267/2
611 37 Brno
phone: | +420 549 49 6244 |
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e‑mail: |
social and academic networks: |
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Total number of publications: 202
2005
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Optical Characterization of TiO2 Thin Films by the Combined Method of Spectroscopic Ellipsometry and Spectroscopic Photometry
Vacuum, year: 2005, volume: 80, edition: 1-3
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Optical measurement of mechanical stresses in diamond-like carbon films
8-th International Symposium on Laser Metrology, year: 2005
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Optical properties of NiO thin films prepared by pulsed laser deposition technique
Applied Surface Science, year: 2005, volume: 244, edition: 1-4
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Optical properties of slightly rough LaNiO3 thin films studied by spectroscopic ellipsometry and reflectometry
Applied Surface Science, year: 2005, volume: 244, edition: 1-4
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Scanning thermal microscopy - theory and applications
Jemná mechanika a optika, year: 2005, volume: 50, edition: 11-12
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Spectroscopic ellipsometry of sinusoidal surface-relief gratings
Applied Surface Science, year: 2005, volume: 244, edition: 1-4
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Spectroscopic ellipsometry on lamellar gratings
Applied Surface Science, year: 2005, volume: 244, edition: 1-4
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Specular spectroscopic ellipsometry for the critical dimension monitoring of gratings fabricated on a thick transparent plate
Journal of Applied Physics, year: 2005, volume: 97, edition: 5
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Thermal stability of the optical properties of plasma deposited diamond-like carbon thin films
Diamond and Related Materials, year: 2005, volume: 14, edition: 11-12
2004
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Atomic Force Microscopy Analysis of Statistical Roughness of GaAs Surfaces Originated by Thermal Oxidation
Microchimica Acta, year: 2004, volume: 147, edition: 3