prof. RNDr. Ivan Ohlídal, DrSc.

2005

• Digital two-wavelength holographic interference microscopy for surface roughness measurement

  OHLÍDAL Miloslav ŠÍR L. JÁKL M. OHLÍDAL Ivan

  Article in Proceedings

  Proceedings of SPIE 5945, 14th Slovak-Czech-Polish Optical Conference on Wave and Quantum Aspects of Contemporary Optics, year: 2005

• Ellipsometry in characterization of thin films

  OHLÍDAL Ivan FRANTA Daniel KLAPETEK Petr

  Article in Proceedings

  Proceedings of the SREN 2005, year: 2005

• Evidence of refractive index change in glass substrates induced by high-density reactive ion plating deposition of SiO2 films

  JAN Mistrík OHLÍDAL Ivan ANTOŠ Roman AOYAMA Mitsuru YAMAGUCHI Tomuo

  Article in Periodical

  Applied Surface Science, year: 2005, volume: 244, edition: 1-4

• Characterization of optical thin films exhibiting defects

  FRANTA Daniel OHLÍDAL Ivan

  Article in Proceedings

  Advances in Optical Thin Films II, year: 2005

• Influence of technological conditions on mechanical stresses inside diamond-like carbon films

  OHLÍDAL Ivan OHLÍDAL Miloslav FRANTA Daniel ČUDEK Vlastimil BURŠÍKOVÁ Vilma KLAPETEK Petr PÁLENÍKOVÁ Kateřina

  Article in Periodical

  Diamond and Related Materials, year: 2005, volume: 14, edition: 11-12

• Měření mechanického napětí v tenkých vrstvách pomocí kombinované optické metody

  OHLÍDAL Ivan OHLÍDAL Miloslav FRANTA Daniel ČUDEK Vlastimil BURŠÍKOVÁ Vilma ŠILER Martin

  Article in Periodical

  Jemná mechanika a optika, year: 2005, volume: 50, edition: 3

• Měření nanodrsnosti pomocí optických metod a mikroskopie atomové síly

  OHLÍDAL Ivan FRANTA Daniel KLAPETEK Petr

  Article in Proceedings

  Kvalita a GPS 2005, year: 2005

• Optical characterization of double layers containing epitaxial ZnSe and ZnTe films

  ŠILER Martin OHLÍDAL Ivan FRANTA Daniel MONTAIGNE-RAMIL Alberto BONANNI Alberta STIFTER David SITTER Helmut

  Article in Periodical

  Journal of Modern Optics, year: 2005, volume: 52, edition: 4

• Optical characterization of non-uniform thin films using imaging spectrophotometry

  OHLÍDAL Miloslav ČUDEK Vladimír OHLÍDAL Ivan KLAPETEK Petr

  Article in Proceedings

  Advances in Optical Thin Films II, year: 2005

• Optical characterization of sol-gel deposited PZT thin films by spectroscopic ellipsometry and reflectometry in near-UV and visible regions

  FRANTA Daniel OHLÍDAL Ivan MISTÍK Jan YAMAGUCHI Tomuo HU Gu Jin DAI Ning

  Article in Periodical

  Applied Surface Science, year: 2005, volume: 244, edition: 1-4