Mgr. Jiří Vohánka, Ph.D.

2019

• Optical Characterization of Non-Stoichiometric Silicon Nitride Films Exhibiting Combined Defects

  VOHÁNKA Jiří OHLÍDAL Ivan OHLÍDAL Miloslav ŠUSTEK Štěpán ČERMÁK Martin ŠULC Václav VAŠINA Petr ŽENÍŠEK Jaroslav FRANTA Daniel

  Article in Periodical

  Coatings, year: 2019, volume: 9, edition: 7, DOI

• Optical properties of the crystalline silicon wafers described using the universal dispersion model

  FRANTA Daniel VOHÁNKA Jiří BRÁNECKÝ Martin FRANTA Pavel ČERMÁK Martin OHLÍDAL Ivan ČECH Vladimír

  Article in Periodical

  Journal of Vacuum Science & Technology B, year: 2019, volume: 37, edition: 6, DOI

• Temperature dependent dispersion models applicable in solid state physics

  FRANTA Daniel VOHÁNKA Jiří ČERMÁK Martin FRANTA Pavel OHLÍDAL Ivan

  Article in Periodical

  Journal of Electrical Engineering, year: 2019, volume: 70, edition: 7, DOI

2018

• Determination of thicknesses and temperatures of crystalline silicon wafers from optical measurements in the far infrared region

  FRANTA Daniel FRANTA Pavel VOHÁNKA Jiří ČERMÁK Martin OHLÍDAL Ivan

  Article in Periodical

  Journal of Applied Physics, year: 2018, volume: 123, edition: 18, DOI

• Different theoretical approaches at optical characterization of randomly rough silicon surfaces covered with native oxide layers

  OHLÍDAL Ivan VOHÁNKA Jiří MISTRÍK Jan ČERMÁK Martin FRANTA Daniel

  Article in Periodical

  Surface and Interface Analysis, year: 2018, volume: 50, edition: 11, DOI

• Ellipsometry of Layered Systems

  OHLÍDAL Ivan VOHÁNKA Jiří ČERMÁK Martin FRANTA Daniel

  Chapter of a book

  Optical Characterization of Thin Solid Films, year: 2018, number of pages: 35 s.

• Optical Characterization of Thin Films Exhibiting Defects

  OHLÍDAL Ivan ČERMÁK Martin VOHÁNKA Jiří

  Chapter of a book

  Optical Characterization of Thin Solid Films, year: 2018, number of pages: 43 s.

• Optical quantities of multi-layer systems with randomly rough boundaries calculated using the exact approach of the Rayleigh–Rice theory

  ČERMÁK Martin VOHÁNKA Jiří OHLÍDAL Ivan FRANTA Daniel

  Article in Periodical

  Journal of modern optics, year: 2018, volume: 65, edition: 14, DOI

• Universal Dispersion Model for Characterization of Thin Films Over Wide Spectral Range

  FRANTA Daniel VOHÁNKA Jiří ČERMÁK Martin

  Chapter of a book

  Optical Characterization of Thin Solid Films, year: 2018, number of pages: 52 s.

• Use of the Richardson extrapolation in optics of inhomogeneous layers: Application to optical characterization

  VOHÁNKA Jiří OHLÍDAL Ivan ŽENÍŠEK Jaroslav VAŠINA Petr ČERMÁK Martin FRANTA Daniel

  Article in Periodical

  Surface and Interface Analysis, year: 2018, volume: 50, edition: 7, DOI