Publication details
Effect of Hydrogen on the Properties of Amorphous Carbon Nitride Films
| Authors | |
|---|---|
| Year of publication | 2012 |
| Type | Article in Proceedings |
| Conference | MANUFACTURING SCIENCE AND TECHNOLOGY, PTS 1-8 |
| MU Faculty or unit | |
| Citation | |
| Doi | http://dx.doi.org/10.4028/www.scientific.net/AMR.383-390.3298 |
| Field | Solid matter physics and magnetism |
| Keywords | hydrogenated a-CNx films; residual stress; r.f. magnetron sputtering; SLEEM; XPS; TDMS; AFM |
| Description | The effect of hydrogen on the properties of amorphous carbon nitride films deposited onto Si substrates by magnetron sputtering device has been studied. The influence of hydrogen to roughness, porous character of films, composition and residual stress was investigated by atomic force microscopy, thermal desorption mass spectroscopy, X-ray photoelectron spectroscopy, scanning low energy electron microscopy and by goniometer equipped with Cu X-ray tube. The adding of hydrogen to nitrogen discharge a causes decrease in the high value of compressive stress (elimination of delamination of the films, increasing of nitrogen content in the bulk). On the other hand hydrogen increases roughness and porosity. |