Temperature stability of the pentacene thin-film phase

• Authors: MOSER Armin; NOVÁK Jiří; FLESCH Heinz-Georg; DJURIC Tatjana; WERZER Oliver; HAASE Anja; RESEL Roland
• Year of publication: 2011
• Type: Article in Periodical
• Magazine / Source: Applied Physics Letters
• Doi: https://doi.org/10.1063/1.3665188
• Keywords: crystal morphology; organic semiconductors; semiconductor thin films; thermal expansion; X-ray diffraction