Publication details
Quantitative analysis of strain relaxation and mosaicity in short period Si m Ge n superlattices using reciprocal space mapping by x-ray diffraction
| Authors | |
|---|---|
| Year of publication | 1994 |
| Type | Article in Periodical |
| Magazine / Source | Solid-State Electronics |
| MU Faculty or unit | |
| Citation | |
| Field | Solid matter physics and magnetism |
| Related projects: |