You are here:
Publication details
Interface study of W-Si/Si and obliquely deposided W/Si multilayers by grazing-incidence high-resolution x-ray diffraction
Authors | |
---|---|
Year of publication | 1995 |
Type | Article in Periodical |
Magazine / Source | J. Phys. D: Appl. Phys. |
MU Faculty or unit | |
Citation | |
Field | Solid matter physics and magnetism |
Related projects: |