Structural investigation of semiconductor nanostructures by x-ray techniques

• Authors: STANGL Julian; HESSE Anke; ROCH Tomáš; HOLÝ Václav
• Year of publication: 2002
• Type: Article in Periodical
• Magazine / Source: Nuclear Instruments & Methods in Physics Research A
• MU Faculty or unit: Faculty of Science
• Field: Solid matter physics and magnetism
• Keywords: Structural investigation of semiconductor nanostructures by x-ray techniques
• Description: Structural investigation of semiconductor nanostructures by x-ray techniques

Related projects

• Self-organization processes on the interfaces during epitaxial growth of semiconductor superlattices
• Physical properties of new materials and layered structures