Aplikace mikroskopie atomové síly při analýze tenkých vrstev ZnSe a ZnTe

• Title in English: Application of Atomic Force Microscopy for Analysis of ZnSe and ZnTe Thin Films
• Authors: OHLÍDAL Ivan; KLAPETEK Petr; FRANTA Daniel
• Year of publication: 2003
• Type: Article in Periodical
• Magazine / Source: Československý časopis pro fyziku
• MU Faculty or unit: Faculty of Science
• web: http://hydra.physics.muni.cz/~franta/bib/CCF53_97.html
• Field: Solid matter physics and magnetism
• Keywords: AFM; ZnSe; ZnTe
• Description: Semiconductor layer ..

Related projects

• Realisation of thelaboratory instrument for surface roughness measurement by holographic interferometry
• Optical and mechanical properties of DLC : Si thin films prepared by the PECVD method