Publication details
Temperature dependence of ellipsometric spectra of poly(methyl-phenylsilane)
| Authors | |
|---|---|
| Year of publication | 2004 |
| Type | Article in Periodical |
| Magazine / Source | Thin Solid Films |
| MU Faculty or unit | |
| Citation | |
| Field | Solid matter physics and magnetism |
| Keywords | temperature; ellipsometric spectra; poly(methyl-phenylsilane); |
| Description | Comprehensive study of the temperature dependence of ultraviolet-visible ellipsometric spectra of thin films of poly(methyl-phenylsilane). It was found the threshold of irreversible changes of its optical response at 373 K and furthermore the average temperature shift of the lowest excitonic band in the reversible regime.The effect of annealing below and above 373 is studied with low- a high-level of the exposure to UV light. |
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