Publication details

Photonic band-gap masks to enhance resolution and depth of focus

Authors

NISTLER John DUCKWORTH Koby CHALOUPKA Jiří BROCK Matt

Year of publication 2007
Type Article in Periodical
Magazine / Source Proceedings of SPIE
MU Faculty or unit

Faculty of Science

Citation
Field Optics, masers and lasers
Keywords lithographic mask; photonic band-gap
Description The authors introduce initial simulation work on Photonic Bandgap Enhanced or PBE reticles that tends to address the manufacturing problems associated with typical PSM reticles while improving potential resolution capabilities to 35 and 25 nm utilizing 193 nm immersion lithography. The proposed approach for manufacturing reduces the overall defect issues associated with PSM approaches.

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