Publication details
Oxygen precipitation studied by x-ray diffraction techniques
| Authors | |
|---|---|
| Year of publication | 2011 |
| Type | Article in Periodical |
| Magazine / Source | Solid State Phenomena |
| MU Faculty or unit | |
| Citation | |
| Field | Solid matter physics and magnetism |
| Keywords | Czochralski silicon; oxygen precipitates; x-ray Laue diffraction |
| Description | We report on study of oxygen precipitates grown in Czochralski silicon wafers investigated by x-ray diffraction in Bragg reflection geometry and Laue transmission geometry. |
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