Micro-imaging performance of multilayers used as monochromators for coherent hard X-ray synchrotron radiation

• Authors: RACK A.; WEITKAMP T.; RIOTTE M.; RACK T.; DIETSCH R.; HOLZ T.; KRÄMER M.; SIEWERT F.; MEDUŇA Mojmír; MORAWE Ch.; CLOETENS P.; ZIEGLER E.
• Year of publication: 2010
• Type: Article in Periodical
• Magazine / Source: Proceedings of SPIE - The International Society for Optical Engineering
• MU Faculty or unit: Faculty of Science
• Web: http://spiedigitallibrary.org/proceedings/resource/2/psisdg/7802/1/78020M_1?isAuthorized=no
• Doi: http://dx.doi.org/10.1117/12.858355
• Field: Solid matter physics and magnetism
• Keywords: Coherence; Multilayer mirrors; Synchrotron radiation; X-ray imaging; X-ray monochromators; X-ray optics; X-ray phase contrast
• Description: We present a systematic study in which multilayers of different composition (W/Si, Mo/Si, Pd/B4C), periodicity (from 2.5 to 5.5 nm), and numbers of layers have been characterised.

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