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Informace o publikaci
Atomic force microscopy characterization of ZnTe epitaxial thin films
Autoři | |
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Rok publikování | 2003 |
Druh | Článek v odborném periodiku |
Časopis / Zdroj | Japanese Journal of Applied Physics |
Fakulta / Pracoviště MU | |
Citace | |
Obor | Fyzika pevných látek a magnetismus |
Klíčová slova | ZnTe epitaxial films; AFM analysis; faceted boundaries |
Popis | In this paper, results concerning atomic force microscopy studies of the upper bounaries of ZnTe epitaxial thin films prepared by molecular beam epitaxy onto gallium arsenide single crystal substrates are presented. It is sohw that the upper boundaries exhibit faceted structure which is described by means of statistical analysis. |
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