Mgr. Filip Münz, PhD.

2019

• Annealing Behavior with Thickness Hindered Nucleation in Small-Molecule Organic Semiconductor Thin Films

  ROZBOŘIL Jakub BROCH Katharina RESEL Roland CAHA Ondřej MÜNZ Filip MIKULÍK Petr ANTHONY John E. SIRRINGHAUS Henning NOVÁK Jiří

  Article in Periodical

  CRYSTAL GROWTH & DESIGN, year: 2019, volume: 19, edition: 7, DOI

2017

• Mid-infrared ellipsometry, Raman and X-ray diffraction studies of AlxGa1-xN/AlN/Si structures

  WANG Chennan CAHA Ondřej MÜNZ Filip KOSTELNÍK Petr NOVÁK Tomáš HUMLÍČEK Josef

  Article in Periodical

  Applied Surface Science, year: 2017, volume: 421, edition: November, DOI

2016

• Magneto-optical investigations of molecular nanomagnet monolayers

  ROZBOŘIL Jakub RECHKEMMER Yvonne BLOOS Dominik MÜNZ Filip WANG Chennan NEUGEBAUER Petr ČECHAL Jan NOVÁK Jiří VAN SLAGEREN Joris

  Article in Periodical

  Dalton Transactions, year: 2016, volume: 45, edition: 18, DOI

2014

• Imaging in NIR *SOI, GaN

  MÜNZ Filip HUMLÍČEK Josef

  Year: 2014

• Metrology of epitaxial layers *GaN

  CAHA Ondřej WANG Chennan MÜNZ Filip HUMLÍČEK Josef

  Year: 2014

• Zařízení pro měření tloušťky polovodičových vrstevnatých struktur SOI

  MÜNZ Filip HUMLÍČEK Josef

  Year: 2014

2013

• Fyzikální praktikum 2

  CAHA Ondřej HEMZAL Dušan CHALOUPKA Jiří MIKULÍK Petr MÜNZ Filip

  Year: 2013, type:

2011

• Bursts in the HETE-2 catalogue

  MÜNZ Filip MAIORANO Elisabetta PIZZICHINI Graziella

  Article in Periodical

  Advances in Space Research, year: 2011, volume: 47, edition: 8

• Infrared ellipsometry of highly oriented pyrolytic graphite

  HUMLÍČEK Josef NEBOJSA Alois MÜNZ Filip MIRIC Milka GAJIC Rados

  Article in Periodical

  Thin Solid Films, year: 2011, volume: 519, edition: 9, DOI

• Optimized calibration and measurement procedures in rotating analyzer and rotating polarizer ellipsometry

  MÜNZ Filip HUMLÍČEK Josef MARŠÍK Přemysl

  Article in Periodical

  Thin Solid Films, year: 2011, volume: 519, edition: 9, DOI