prof. RNDr. Ivan Ohlídal, DrSc.

2015

• Wide spectral range characterization of antireflective coatings and their optimization

  FRANTA Daniel NEČAS David OHLÍDAL Ivan JANKUJ Jiří

  Article in Proceedings

  Conference on Optical Systems Design - Optical Fabrication, Testing, and Metrology V, year: 2015

2014

• Antireflexní vrstva z materiálů Al2O3/SiO2 pro hlubokou ultrafialovou (DUV) oblast spektra na vlnové délce 266nm

  BŘEZINA Jaromír OHLÍDAL Ivan

  Year: 2014

• Assessment of non-uniform thin films using spectroscopic ellipsometry and imaging spectroscopic reflectometry

  NEČAS David OHLÍDAL Ivan FRANTA Daniel ČUDEK Vladimír OHLÍDAL Miloslav VODÁK Jiří SLÁDKOVÁ Lucia ZAJÍČKOVÁ Lenka ELIÁŠ Marek VIZĎA František

  Article in Periodical

  Thin Solid Films, year: 2014, volume: 571, edition: november, DOI

• Broadening of dielectric response and sum rule conservation

  FRANTA Daniel NEČAS David ZAJÍČKOVÁ Lenka OHLÍDAL Ivan

  Article in Periodical

  Thin Solid Films, year: 2014, volume: 571, edition: November, DOI

• Consolidated series for efficient calculation of the reflection and transmission in rough multilayers

  NEČAS David OHLÍDAL Ivan

  Article in Periodical

  Optics Express, year: 2014, volume: 22, edition: 4, DOI

• Dispersion model of two-phonon absorption: application to c-Si

  FRANTA Daniel NEČAS David ZAJÍČKOVÁ Lenka OHLÍDAL Ivan

  Article in Periodical

  OPTICAL MATERIALS EXPRESS, year: 2014, volume: 4, edition: 8, DOI

• Improved combination of scalar diffraction theory and Rayleigh-Rice theory and its application to spectroscopic ellipsometry of randomly rough surfaces

  OHLÍDAL Ivan FRANTA Daniel NEČAS David

  Article in Periodical

  Thin Solid Films, year: 2014, volume: 571, edition: November, DOI

• Measurement of thickness distribution, optical constants, and roughness parameters of rough nonuniform ZnSe thin films

  NEČAS David OHLÍDAL Ivan FRANTA Daniel OHLÍDAL Miloslav ČUDEK Vladimír VODÁK Jiří

  Article in Periodical

  Applied Optics, year: 2014, volume: 53, edition: 25, DOI

• Utilization of the sum rule for construction of advanced dispersion model of crystalline silicon containing interstitial oxygen

  FRANTA Daniel NEČAS David ZAJÍČKOVÁ Lenka OHLÍDAL Ivan

  Article in Periodical

  Thin Solid Films, year: 2014, volume: 571, edition: november, DOI

2013

• Advanced modeling for optical characterization of amorphous hydrogenated silicon films

  FRANTA Daniel NEČAS David ZAJÍČKOVÁ Lenka OHLÍDAL Ivan STUCHLÍK Jiří

  Article in Periodical

  Thin Solid Films, year: 2013, volume: 541, edition: Aug, DOI