prof. RNDr. Ivan Ohlídal, DrSc.

2017

• Temperature-dependent dispersion model of float zone crystalline silicon

  FRANTA Daniel DUBROKA Adam WANG Chennan GIGLIA Angelo VOHÁNKA Jiří FRANTA Pavel OHLÍDAL Ivan

  Article in Periodical

  Applied Surface Science, year: 2017, volume: 421, edition: November, DOI

• Universal dispersion model for characterization of optical thin films over wide spectral range: Application to magnesium fluoride

  FRANTA Daniel NEČAS David GIGLIA Angelo FRANTA Pavel OHLÍDAL Ivan

  Article in Periodical

  Applied Surface Science, year: 2017, volume: 421, edition: November, DOI

2016

• Materials Pushing the Application Limits of Wire Grid Polarizers further into the Deep Ultraviolet Spectral Range

  SIEFKE Thomas KROKER Stefanie PFEIFFER Kristin PUFFKY Oliver DIETRICH Kay FRANTA Daniel OHLÍDAL Ivan SZEGHALMI Adriana KLEY Ernst-Bernhard TÜNNERMANN Andreas

  Article in Periodical

  Advanced Optical Materials, year: 2016, volume: 4, edition: 11, DOI

• Optical characterization of SiO2 thin films using universal dispersion model over wide spectral range

  FRANTA Daniel NEČAS David OHLÍDAL Ivan GIGLIA Angelo

  Article in Proceedings

  Conference on Optical Micro- and Nanometrology VI, year: 2016

• Simultaneous determination of optical constants, local thickness and roughness of ZnSe thin films by imaging spectroscopic reflectometry

  NEČAS David OHLÍDAL Ivan FRANTA Daniel OHLIDAL M. VODAK J.

  Article in Periodical

  Journal of Optics, year: 2016, volume: 18, edition: 1, DOI

2015

• Dispersion model for optical thin films applicable in wide spectral range

  FRANTA Daniel NEČAS David OHLÍDAL Ivan GIGLIA Angelo

  Article in Proceedings

  Conference on Optical Systems Design - Optical Fabrication, Testing, and Metrology V, year: 2015

• Possibilities and limitations of imaging spectroscopic reflectometry in optical characterization of thin films

  OHLÍDAL Miloslav OHLÍDAL Ivan NEČAS David VODÁK Jiří FRANTA Daniel NÁDASKÝ Pavel VIŽĎA František

  Article in Proceedings

  Conference on Optical Systems Design - Optical Fabrication, Testing, and Metrology V, year: 2015

• Simultaneous determination of dispersion model parameters and local thickness of thin films by imaging spectrophotometry

  NEČAS David VODÁK Jiří OHLÍDAL Ivan OHLÍDAL Miloslav MAJUMDAR Abhijit ZAJÍČKOVÁ Lenka

  Article in Periodical

  Applied Surface Science, year: 2015, volume: 350, edition: SEP, DOI

• Simultaneous determination of optical constants, local thickness, and local roughness of thin films by imaging spectroscopic reflectometry

  NEČAS David OHLÍDAL Ivan VODÁK Jiří OHLÍDAL Miloslav FRANTA Daniel

  Article in Proceedings

  Conference on Optical Systems Design - Optical Fabrication, Testing, and Metrology V, year: 2015

• Universal dispersion model for characterization of optical thin films over wide spectral range: Application to hafnia

  FRANTA Daniel NEČAS David OHLÍDAL Ivan

  Article in Periodical

  Applied Optics, year: 2015, volume: 54, edition: 31, DOI