prof. RNDr. Ivan Ohlídal, DrSc.
Head, Optics for Thin films and Solid surfaces
office: pav. 06/01031
Kotlářská 267/2
611 37 Brno
phone: | +420 549 49 6244 |
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e‑mail: |
social and academic networks: |
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Total number of publications: 202
2013
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Application of sum rule to the dispersion model of hydrogenated amorphous silicon
Thin Solid Films, year: 2013, volume: 539, edition: Jul, DOI
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Ellipsometric characterization of inhomogeneous non-stoichiometric silicon nitride films
Surface and Interface Analysis, year: 2013, volume: 45, edition: 7, DOI
2011
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Anisotropy-enhanced depolarization on transparent film/substrate system
Thin Solid Films, year: 2011, volume: 519, edition: 9, DOI
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Ellipsometric characterisation of thin films non-uniform in thickness
Thin Solid Films, year: 2011, volume: 519, edition: 9, DOI
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Measurement of the thickness distribution and optical constants of non-uniform thin films
Measurement Science and Technology, year: 2011, volume: 22, edition: 8, DOI
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Optical characterisation of SiOxCyHz thin films non-uniform in thickness using spectroscopic ellipsometry, spectroscopic reflectometry and spectroscopic imaging reflectometry
Thin Solid Films, year: 2011, volume: 519, edition: 9, DOI
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Optical characterization of HfO2 thin films
Thin Solid Films, year: 2011, volume: 519, edition: 18, DOI
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Variable-angle spectroscopic ellipsometry of considerably non-uniform thin films
Journal of Optics, year: 2011, volume: 13, edition: 8, DOI
2010
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Development of transparent protective coatings on polycarbonate substrates using PECVD
Year: 2010, type: Conference abstract
2009
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Application of spectroscopic imaging reflectometry to analysis of area non-uniformity in diamond-like carbon films
Diamond and Related Materials, year: 2009, volume: 18, edition: 2-3