prof. RNDr. Josef Humlíček, CSc.

2015

• SiC characterization using optical and x-ray techniques

  HUMLÍČEK Josef CAHA Ondřej

  Year: 2015

2014

• Imaging in NIR *SOI, GaN

  MÜNZ Filip HUMLÍČEK Josef

  Year: 2014

• Metrology of epitaxial layers *GaN

  CAHA Ondřej WANG Chennan MÜNZ Filip HUMLÍČEK Josef

  Year: 2014

• Raman and interband optical spectra of epitaxial layers of the topological insulators Bi2Te3 and Bi2Se3 on BaF2 substrates

  HUMLÍČEK Josef HEMZAL Dušan DUBROKA Adam CAHA Ondřej STEINER Hubert BAUER Gunther SPRINGHOLZ Guenther

  Article in Periodical

  Physica Scripta, year: 2014, volume: T162, edition: September, DOI

• Zařízení pro měření rekombinačních procesů v epitaxních vrstvách křemíku

  BOČÁNEK Luděk HUMLÍČEK Josef

  Year: 2014

• Zařízení pro měření tloušťky polovodičových vrstevnatých struktur SOI

  MÜNZ Filip HUMLÍČEK Josef

  Year: 2014

2013

• Data Analysis for Nanomaterials: Effective Medium Approximation, Its Limits and Implementations

  HUMLÍČEK Josef

  Chapter of a book

  Ellipsometry at the Nanoscale, year: 2013, number of pages: 34 s.

• Growth, Structure, and Electronic Properties of Epitaxial Bismuth Telluride Topological Insulator Films on BaF2 (111) Substrates

  CAHA Ondřej DUBROKA Adam HUMLÍČEK Josef HOLÝ Václav STEINER Hubert UL-HASSAN M. SANCHEZ-BARRIGA Jaime RADER Oliver STANISLAVCHUK T. N. SIRENKO Andrei A. BAUER Günther SPRINGHOLZ Günter

  Article in Periodical

  Crystal Growth & Design, year: 2013, volume: 13, edition: 8, DOI

• Infrared Ellipsometric Investigations of Free Carriers and Lattice Vibrations in Superconducting Cuprates

  CHALOUPKA Jiří MUNZAR Dominik HUMLÍČEK Josef

  Chapter of a book

  Ellipsometry at the Nanoscale, year: 2013, number of pages: 23 s.

• Lattice constants and optical response of pseudomorph Si-rich SiGe:B

  CAHA Ondřej KOSTELNÍK P. ŠIK Jan KIM Y.D. HUMLÍČEK Josef

  Article in Periodical

  Applied Physics Letters, year: 2013, volume: 103, edition: 20, DOI