Project information
Physical properties of new materials and layered structures
- Project Identification
- MSM 143100002
- Project Period
- 1/1999 - 12/2004
- Investor / Pogramme / Project type
-
Ministry of Education, Youth and Sports of the CR
- Research Intents
- MU Faculty or unit
- Faculty of Science
- Keywords
- semiconductors;low-dimensional structures;quantum dots;organic layers;ferroelectrics;high-temperature superconductors;ellipsometry;reflectometry;x-ray diffraction;x-ray reflection
Results
Publications
Total number of publications: 212
1993
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Denuded zone depth studied by x-ray diffraction
3rd scientific and busines conference SILICON 92, year: 1993, volume: 1992, edition: 1
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Exciton line shapes of GaAs/AlAs multiple quantum wells
Phys. Rev. B, year: 1993, volume: 48(1993), edition: 8
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Heavy hole / Light hole splitting in GaAs/AlAs superlattices
Phys. Stat. Sol. (b), year: 1993, volume: 175(1993), edition: -
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Infrared refracctive index of germanium-silicon alloy crystals
Appl. Opt., year: 1993, volume: 31(1992), edition: 1
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IR ellipsometry of the highly anisotropic materials alpha - SiO2 and alpha-Al2O3
Thin Solid Films, year: 1993, volume: 234, edition: 1
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Lattice vibrations of Y(1-x) Pr( x) Ba(2)Cu(3)O(7): theory and experiment
Physica C, year: 1993, volume: 1993, edition: 3
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Mid- and near - IR ellipsometry of Y 1-x Pr x Ba 2 Cu 3 O 7 epitaxial films
Thin Solid Films, year: 1993, volume: 234, edition: 1
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Normal-state infrared response from ellipsometric measurements: YBa(2)Cu(3)O(7) and PrBa(2)Cu(3)O(7)
Electronic Properties of high-Tc Superconductors, year: 1993
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Oblique incidence specular reflectance spectra of a Bi 2 Se 3: Ge single crystal at plasma resonance
Phys. Stat. Sol. (a), year: 1993, volume: 132(1992), edition: K97
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Sensitivity of optical measurements of planar stratified structures and reduction of experimentsl data
Year: 1993, edition: Vyd. 1, number of pages: 99 s.