1994

• Interpretation of infrared transmittance spectra of SiO 2 thin films

  KUČÍRKOVÁ Assja NAVRÁTIL Karel

  Article in Periodical

  Applied Spectroscopy, year: 1994, volume: 48(1994), edition: 1

• Nonspecular x-ray reflection from rough multilayers

  HOLÝ Václav

  Article in Periodical

  Physical Review B, year: 1994, volume: 49, edition: 15

• Quantitative analysis of strain relaxation and mosaicity in short period Si m Ge n superlattices using reciprocal space mapping by x-ray diffraction

  KOPPENSTEINER E. HOLÝ Václav

  Article in Periodical

  Solid-State Electronics, year: 1994, volume: 37, edition: 4-6

• Structural properties of perfect ZnTe epilayers on (001) GaAs substrates

  LANG M. HOLÝ Václav

  Article in Periodical

  Journal of Crystal Growth, year: 1994, volume: 138, edition: -

• The influence of specular interface reflection on grazing incidence x-ray diffraction and diffuse scattering from superlattices

  BAUMBACH G.T. HOLÝ Václav

  Article in Periodical

  Physica B, year: 1994, volume: 198, edition: -

• The influence of thermal processing on structural and electrical properties of Wx Si 1-x/Si multilayers

  VÁVRA I. HOLÝ Václav KUBĚNA Josef

  Article in Periodical

  Nuclear Instruments & Methods in Physics Research A, year: 1994, volume: 350, edition: -

• Transverse and longitudinal vibration modes in alpha-quartz

  HUMLÍČEK Josef

  Article in Periodical

  Philosophical Magazine B, year: 1994, volume: 70(1994), edition: 3

• Undesirable Occurrence of the Interference Fringes in IR Transmittance Spectra

  KUČÍRKOVÁ Assja NAVRÁTIL Karel

  Article in Periodical

  Scripta Fac.Brun., year: 1994, volume: 29(1994), edition: 1

• X-ray characterization of semiconductor surfaces and interfaces

  PLOTZ W. HOLÝ Václav

  Article in Periodical

  J. Phys. III France 4, year: 1994, volume: 1994, edition: -

• X-ray triple-cristal diffractometry of defects in epitaxic layers

  HOLÝ Václav

  Article in Periodical

  J. Appl. Cryst., year: 1994, volume: 27, edition: -