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Spektrální elipsometrická charakterizace tenkých epitaxních vrstev Si_(1-x)Ge_x
Title in English | Spectroellipsometric characterization of thin epitaxial Si_(1-x)Ge_x lazers |
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Authors | |
Year of publication | 1994 |
Type | Chapter of a book |
MU Faculty or unit | |
Citation | |
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