prof. RNDr. Václav Holý, CSc.

1998

• Highly regular self-organization of step bunches during growth of SiGe on Si(113)

  DARHUBER A.A. HOLÝ Václav STANGL J. MIKULÍK Petr BRUNNER K. ABSTREITER G. BAUER G.

  Article in Periodical

  Appl. Phys. Lett., year: 1998, volume: 73(1998), edition: -

• High-resolutin x-ray diffraction and x-ray reflectivity studies of short-period CdTe/MnTe-superlattices

  STANGL J. DARHUBER A.A. HOLÝ Václav DE NAUROIS M. FERREIRA S. FASCHINGER W. BAUER G.

  Article in Periodical

  Journal of crystal growth, year: 1998, volume: 1998, edition: 184/185

• High-resolution x-ray scattering from thin films and multilayers

  HOLÝ Václav PIETSCH U. BAUMBACH T.

  Monograph

  Year: 1998, number of pages: 256 s.

• Characterization of surfaces and interfaces by hard x-ray reflectometry and diffuse scattering at grazing incidence

  JERGEL M. MAJKOVÁ E. LUBY S. SENDERÁK R. HOLÝ Václav

  Article in Periodical

  Acta Physica Slovaca, year: 1998, volume: 1998, edition: 48

• Oblique roughness replication in strained SiGe/Si multilayers

  HOLÝ Václav DARHUBER A.A. STANGL J. BAUER G. NUETZEL J. ABSTREITER G.

  Article in Periodical

  Physical Review B, year: 1998, volume: (57)1998, edition: 19

• Self-organized growth of three-dimensional quantum-dot crystals with fcc-like stacking and a tunable lattice constant

  SPRINGHOLZ G. HOLÝ Václav PINCZOLITS M. BAUER G.

  Article in Periodical

  Physical Review Letters, year: 1998, volume: 282(1998), edition: 23

• Strain relaxation and surface morphology of compositionally graded Si/SiGe buffers

  LI J.H. SPRINGHOLZ G. STANGL G. SEYRINGER H. HOLÝ Václav SCHAFFLER F. BAUER G.

  Article in Periodical

  J. Vac. Sci & Technol., year: 1998, volume: 1998, edition: B16

• Structural characterization of self-assembled Ge dot multilayers by x-ray diffraction and reflectivity methods

  DARHUBER A.A. HOLÝ Václav SCHITTENHELM P. STANGL J. KEGEL I. KOVATS Z. METZGER T.H. BAUER G. ABSTREITER G. GRUEBEL G.

  Article in Periodical

  Physica E 2, year: 1998, volume: 1998, edition: -

• X-ray reflectivity investigations of the interface morphology in strained SiGe/Si multilayers

  HOLÝ Václav DARHUBER A.A. STANGL J. BAUER G. NUTZEL J. ABSTREITER G.

  Article in Periodical

  Semicond. Sci. Technol., year: 1998, volume: 13(1998), edition: -

• X-ray scattering study of interface roughness correlation in Mo/Si and Ti/C multilayers for X-UV optics

  JERGEL M. HOLÝ Václav MAJKOVÁ E. LUBY S. SENDERÁK R. STOCK H.J. MENKE D. KLEINEBERG U. HEINZMANN U.

  Article in Periodical

  Physica B condensed matter, year: 1998, volume: 253(1998), edition: -