prof. RNDr. Václav Holý, CSc.

1997

• Structural characterization of self-assembled quantum dot structures by X-ray diffraction techniques

  DARHUBER A.A. STANGL J. HOLÝ Václav BAUER G. KROST A. GRUNDMANN M. BIMBERG D. USTINOV V.M. KOP'EV P.S. KOSOGOV A.O. WERNER P.

  Article in Periodical

  Thin Solid Films, year: 1997, volume: 1997, edition: 303

• X-ray reflectivity reciprocal space mapping of strained SiG /Si superlattices

  HOLÝ Václav

  Article in Periodical

  II Nuovo Cimento, year: 1997, volume: 1997, edition: 19 D

1996

• Elastic strains in GaAs/AlAs quantum dots studied by high resolution. X-ray diffraction

  HOLÝ Václav

  Article in Periodical

  Solid - State Electronics, year: 1996, volume: 40(1996), edition: 1-8

• High Resolution X-Ray Reciprocal Space Mapping

  BAUER G. HOLÝ Václav LI J.

  Article in Periodical

  Acta Physica Polonica A, year: 1996, volume: 1996, edition: 89

• Interface evolution after thermal treatment of Tungsten/ Silicon multilayers

  JERGEL Matej HOLÝ Václav BOCHNÍČEK Zdeněk MAJKOVÁ Eva LUBY Štefan

  Article in Periodical

  Acta Crystallographica A, Suppl., year: 1996, volume: 52, edition: -

• Interface roughness correlation in tungsten/silicon multilayers

  JERGEL M. HOLÝ Václav

  Article in Periodical

  J. Mag. Materials, year: 1996, volume: 1996, edition: 156

• Local Surface Deformations Induced by Interfacial Misfit Dislocations in Lattice-mismatched heteroepitaxy of EuTe on PbTe(111)

  SPRINGHOLZ G. BAUER G. HOLÝ Václav

  Article in Periodical

  Surface Science, year: 1996, volume: 365(1996), edition: -

• Many crystal x-ray diffractometry on superlattices

  HOLÝ Václav

  Article in Periodical

  Heterostructure Epitaxy and Devices. NATO ASI Series 3. Kluwer Acad. Publl. Dordrecht (D4), year: 1996, volume: 1996, edition: 11

• Quantitative analysis of elastic strains in GaAs/AlAs quantum dots

  DARHUBER A. HOLÝ Václav

  Article in Periodical

  Physica B, year: 1996, volume: 1996, edition: 227

• Quantitative Study of Interface Roughness Replication in Multilayers Using X-ray Reflectivity and Transmission Electron Microscopy

  CHLÁDEK M. HOLÝ Václav

  Article in Periodical

  Appl. Phys. Lett., year: 1996, volume: 69(19960, edition: 9