Mgr. Daniel Franta, Ph.D.
Výzkumný pracovník II, Optics for Thin films and Solid surfaces
Office: pav. 07/02012
Kotlářská 267/2
611 37 Brno
Phone: | +420 549 49 3836 |
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E‑mail: |
social and academic networks: |
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Total number of publications: 215
2000
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Analysis of thin films by optical multi-sample methods
Acta Physica Slovaca, year: 2000, volume: 50, edition: 4
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Atomic force microscopy measurements of surface roughness quantities important in optics of surfaces and thin films
Proceedings of the 4th Seminar on Quantitative Microscopy, year: 2000
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Ellipsometry of Thin Film Systems
Progress in Optics, Vol. 41 (Ed. E. Wolf), edition: Vyd. 1, year: 2000, number of pages: 102 s.
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Matrix formalism for imperfect thin films
Acta physica slovaca, year: 2000, volume: 50, edition: 4
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Optical characterization of inhomogeneous thin films of ZrO2 by spectroscopic ellipsometry and spectroscopic reflectometry
Surface and Interface Analysis, year: 2000, volume: 30, edition: 1
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Optical characterization of thin films with randomly rough boundaries using the photovoltage method
Thin Solid Films, year: 2000, volume: 366, edition: 1
1999
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Comparison of optical and non-optical methods for measuring surface roughness
Proceedings of SPIE 3820, 11th Slovak-Czech-Polish Optical Conference on Wave and Quantum Aspects of Contemporary Optics, year: 1999
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Complete Optical Characterization of the SiO2/Si System by Spectroscopic Ellipsometry Spectroscopic Reflectometry and Atomic Force Microscopy
Surface and Interface Analysis, year: 1999, volume: 28, edition: 1
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Determination of the basic parameters characterizing the roughness of metal surfaces by laser light scattering
Journal of modern optics, year: 1999, volume: 46, edition: 2
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Characterisation of DLC Films Prepared by PECVD
Proceedings of 12th Symposium on Application of Plasma Processes, year: 1999