RNDr. Alois Nebojsa
Researcher, Department of Condensed Matter Physics
office: pav. 09/02022
Kotlářská 267/2
611 37 Brno
phone: | +420 549 49 6049 |
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Total number of publications: 12
2021
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Nanoimaging of Orientational Defects in Semiconducting Organic Films
Journal of Physical Chemistry C, year: 2021, volume: 125, edition: 17, DOI
2019
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Characterization of Fe2O3 thin film on highly oriented pyrolytic graphite by AFM, Ellipsometry and XPS
Applied Surface Science, year: 2019, volume: 493, edition: NOV 1 2019, DOI
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Characterization of the native oxide on CdTe surfaces
Materials Science-Poland, year: 2019, volume: 37, edition: 2, DOI
2011
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Infrared ellipsometry of highly oriented pyrolytic graphite
Thin Solid Films, year: 2011, volume: 519, edition: 9, DOI
2008
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Dynamics of UV degradation of PMPSi in vacuum and in the air using in-situ ellipsometry
physica status solidi (c), year: 2008, volume: 5, edition: 5
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Temperature dependence of ellipsometric spectra of Fe and CrNiAl steel
physica status solidi (c), year: 2008, volume: 5, edition: 5
2004
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In situ analysis of PMPSi by spectroscopic ellipsometry and XPS
Surface and Interface Analysis, year: 2004, volume: 2004, edition: 36
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In situ analysis of PMPSi thin films by spectroscopic ellipsometry
Jemná mechanika a optika, year: 2004, volume: 9/2004, edition: 9
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Temperature dependence of ellipsometric spectra of poly(methyl-phenylsilane)
Thin Solid Films, year: 2004, volume: 455/2004, edition: may
1999
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Optical characterisation of a thick MOVPE InSb film on GaAs
Workshop proceedings EW MOVPE VIII, year: 1999