prof. RNDr. Ivan Ohlídal, DrSc.
Head, Optics for Thin films and Solid surfaces
office: pav. 06/01031
Kotlářská 267/2
611 37 Brno
phone: | +420 549 49 6244 |
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e‑mail: |
social and academic networks: |
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Total number of publications: 202
2008
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Optical characterization of non-stoichiometric silicon nitride films
physica status solidi (c), year: 2008, volume: 5, edition: 5
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Optical characterization of phase changing Ge2Sb2Te5 chalcogenide films
physica status solidi (c), year: 2008, volume: 5, edition: 5
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Optical quantities of rough films calculated by Rayleigh-Rice theory
physica status solidi (c), year: 2008, volume: 5, edition: 5
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Spectroscopic ellipsometry and reflectometry of statistically rough surfaces exhibiting wide intervals of spatial frequencies
physica status solidi (c), year: 2008, volume: 5, edition: 5
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Surface morphology of amorphous hydrocarbon thin films deposited in pulsed radiofrequency discharge
Chem. listy, year: 2008, volume: 102, edition: 16
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Surface morphology of amorphous hydrocarbon thin films deposited in pulsed radiofrequency discharge
Year: 2008, type: Conference abstract
2007
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Atomic force microscopy studies of cross-sections of columnar films
Measurement Science and Technology, year: 2007, volume: 18, edition: 2
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Correlation of thermal stability of the mechanical and optical properties of diamond-like carbon films
Diamond and Related Materials, year: 2007, volume: 16, edition: 4-7
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Study of thickness reduction of a-C:H thin film under UV light irradiation
Proceedings of ICPIG XXVIII Conference, year: 2007
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UV light enhanced oxidation of a-C:H thin film in air: A study of thickness reduction
Optoelectronics and Advanced Materials - Rapid Communications, year: 2007, volume: 1, edition: 11