prof. RNDr. Josef Humlíček, CSc.
Professor, Department of Condensed Matter Physics
office: pav. 09/02014
Kotlářská 267/2
611 37 Brno
phone: | +420 549 49 4505 |
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e‑mail: |
social and academic networks: |
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Total number of publications: 134
2004
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Diffraction effects in infrared ellipsometry of conducting samples
Thin Solid Films, year: 2004, volume: 455-456, edition: 1
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Electronic Structure and Optical Properties of InAs/GaAs Quantum Dots
WDS'04 Proceedings of contributed papers, year: 2004
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Far-infrared ellipsometry using a synchrotron light source - the dielectric response of the cuprate high Tc superconductors
Thin Solid Films, year: 2004, volume: 455-456, edition: 1
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In situ analysis of PMPSi thin films by spectroscopic ellipsometry
Jemná mechanika a optika, year: 2004, volume: 9/2004, edition: 9
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Infrared Absorption Spectroscopy of Oxygen Precipitates in Czochralski Silicon
WDS'04 Proceedings of Contributed Papers, year: 2004
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Infrared Absorption Spectroscopy of Oxygen Precipitates in Nitrogen-doped Czochralski Silicon
Proceedings of The Ninth Scientific and Business Conference SILICON 2004, year: 2004
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Infrared study of YBa2Cu3O7/La0.67Ca0.33MnO3 superlattices
Thin Solid Films, year: 2004, volume: 2004, edition: 455
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Proximity induced metal-insulator transition in YBa2Cu3O7/La2/3Ca1/3MnO3 superlattices
Physical Review B, year: 2004, volume: 69, edition: 6
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Temperature dependence of ellipsometric spectra of poly(methyl-phenylsilane)
Thin Solid Films, year: 2004, volume: 455/2004, edition: may
2003
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Strain field in quantum dots
WDS'03 Proceedings of Contributed Papers, year: 2003