prof. RNDr. Václav Holý, CSc.

1994

• X-ray characterization of semiconductor surfaces and interfaces

  PLOTZ W. HOLÝ Václav

  Article in Periodical

  J. Phys. III France 4, year: 1994, volume: 1994, edition: -

• X-ray triple-cristal diffractometry of defects in epitaxic layers

  HOLÝ Václav

  Article in Periodical

  J. Appl. Cryst., year: 1994, volume: 27, edition: -

1993

• Denuded zone depth studied by x-ray diffraction

  BOCHNÍČEK Zdeněk HOLÝ Václav KUBĚNA Josef

  Article in Periodical

  3rd scientific and busines conference SILICON 92, year: 1993, volume: 1992, edition: 1

• The diffuse x-ray scattering in real periodical superlatices

  HOLÝ Václav KUBĚNA Josef OHLÍDAL Ivan

  Article in Periodical

  Superlattices and Microstructures, year: 1993, volume: 12, edition: 1

• Triple crystal x-ray diffractometry of periodic arrays of semiconductor quantum wires

  HOLÝ Václav

  Article in Periodical

  Appl. Phys. Lett., year: 1993, volume: 63, edition: 23

• X-ray diffraction and reflectance, raman scattering and photoluminiscence characterization of thermally annealed epitaxial Si 1-x Ge x layers

  LÍBEZNÝ Milan HOLÝ Václav KUBĚNA Josef

  Article in Periodical

  Thin Solid Films, year: 1993, volume: 1993, edition: 2

• X-ray diffractometry of small defects in layered systems

  HOLÝ Václav KUBĚNA Josef

  Article in Periodical

  J. Phys. D: Appl. Phys., year: 1993, volume: 26, edition: -

• X-ray double and triple crystal diffractometry of mosaic structure in heteroepitaxial layers

  HOLÝ Václav KUBĚNA Josef

  Article in Periodical

  J. Appl. Phys., year: 1993, volume: 74, edition: 3

• X-ray double and triple crystal diffractometry of silicon crystals with small defects

  HOLÝ Václav KUBĚNA Josef

  Article in Periodical

  Phys. Stat. Sol. (b), year: 1993, volume: 1992, edition: -

• X-ray reflection from rough layered systems

  HOLÝ Václav KUBĚNA Josef OHLÍDAL Ivan

  Article in Periodical

  Phys. Rev. B, year: 1993, volume: 47, edition: 23