prof. RNDr. Václav Holý, CSc.

1996

• Scanning-tunneling-microscopy Observation of Stress-driven Surface Diffusion Due to Localized Strain Fields of Misfit Dislocations in Heteroepitaxy

  SPRINGHOLZ G. BAUER G. HOLÝ Václav

  Article in Periodical

  Physical Review B, year: 1996, volume: 54(1996), edition: -

• Structural characterization of reactive ion-etched semicond uctor nanostructures using x-ray reciprocal space mapping

  BAUER G. DARHUBER A. HOLÝ Václav

  Article in Periodical

  Mat. Res. Soc. Symp. Proc., year: 1996, volume: 1996, edition: 405

• Theoretical description of multiple crystal arrangements

  HOLÝ Václav MIKULÍK Petr

  Article in Proceedings

  X-ray and neutron dynamical diffraction: theory and applications, year: 1996

• Thermal Stability of SIS Tunnel Junction with Silicon Barrier

  VÁVRA I. HOLÝ Václav KUBĚNA Josef BOCHNÍČEK Zdeněk

  Article in Periodical

  Czechoslovak Journal of Physic, Suppl. S2, year: 1996, volume: 46(1996), edition: S2

• X-ray and neutron diffuse scattering from multilayers of fatty acid salt molecules

  STOEMMER R. HOLÝ Václav

  Article in Periodical

  Physica B, year: 1996, volume: 1996, edition: 221

• X-ray reflectivity and diffuse scattering study of thermally treated XSi/Si multilayers

  JERGEL M. HOLÝ Václav

  Article in Periodical

  Mater. Sci. Forum, year: 1996, volume: 1996, edition: 228-231

• X-ray studies of surfaces and interfaces

  JERGEL Matej HOLÝ Václav BOCHNÍČEK Zdeněk

  Article in Periodical

  Bulletin Krystalografické společnosti Materials Structure, year: 1996, volume: 3, edition: 3

1995

• Crystalline and Quasi-cristalline Patterns in X-Ray Diffraction from Periodic Arrays of Quantum Dots

  DARHUBER A.A. HOLÝ Václav

  Article in Periodical

  Europhysics Letters, year: 1995, volume: 32(1995), edition: 2

• Determination of threading dislocation density in hetero-epitaxial layers by diffuse x-ray scattering

  KOPPENSTEINER E. HOLÝ Václav

  Article in Periodical

  J. Phys. D: Appl. Phys., year: 1995, volume: 28, edition: -

• Diffuse x-ray scattering from misfit dislocations in SiGe epitaxial layers with graded Ge content

  HOLÝ Václav

  Article in Periodical

  J. Appl. Phys., year: 1995, volume: 78(1995), edition: 8